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Radiation effects in InAsSb strained-layer superlattice photodiodes induced by dose-rate and transient x-ray environments

Conference ·
OSTI ID:6709597
;  [1];  [2]
  1. Sandia National Labs., Albuquerque, NM (USA)
  2. Air Force Weapons Lab., Kirtland AFB, NM (USA)
A side-by-side measurement was made of the gamma-flux noise in an InAsSb strained-layer superlattice (SLS) photodiode and a comparable HgCdTe photodiode. Correcting for minor differences in detector quantum efficiency and area, we found that the SLS can operate in a gamma-flux {ge} 10x that limiting HgCdTe detector performance. Transient photoresponse measurements on an InAsSb SLS detector were performed using a pulsed x-ray source. A detector recovery time of 150 nsec was observed, and modeling of the transient response predicted a minority carrier lifetime of 350 nsec and a diffusion length of 2 {mu}m. 10 refs., 4 figs.
Research Organization:
Sandia National Labs., Albuquerque, NM (USA)
Sponsoring Organization:
DOE/DP
DOE Contract Number:
AC04-76DP00789
OSTI ID:
6709597
Report Number(s):
SAND-90-0955C; CONF-900396--4; ON: DE90015000
Country of Publication:
United States
Language:
English