Optical absorption spectra of surface or interface states in hydrogenated amorphous silicon
Journal Article
·
· Appl. Phys. Lett.; (United States)
The optical absorption of doped and undoped hydrogenated amorphous silicon (a-Si:H) films ranging from 5 nm to 10 ..mu..m was measured using photothermal deflection spectroscopy. The absorption spectra show that there is a high defect layer associated with the surface or interface of the film. From comparison of defect absorption and dangling bond spin densities, it is found that a-Si:H films which have approx.10/sup 15/ bulk defects/cm/sup 3/ exhibit surface or interface layers with approx.10/sup 12/ dangling bonds/cm/sup 2/.
- Research Organization:
- Xerox Palo Alto Research Center, Palo Alto, California 94304
- OSTI ID:
- 6649422
- Journal Information:
- Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 42:1; ISSN APPLA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
360603* -- Materials-- Properties
ABSORPTION
AMORPHOUS STATE
ANGULAR MOMENTUM
CHEMICAL BONDS
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
DATA
DIMENSIONS
DOPED MATERIALS
ENERGY LEVELS
EXPERIMENTAL DATA
FILMS
HYDRIDES
HYDROGEN COMPOUNDS
INFORMATION
INTERFACES
LAYERS
MATERIALS
NUMERICAL DATA
OPTICAL PROPERTIES
PARTICLE PROPERTIES
PHYSICAL PROPERTIES
SILANES
SILICON COMPOUNDS
SPECTRA
SPECTROSCOPY
SPIN
SURFACES
THICKNESS
WAVELENGTHS
360603* -- Materials-- Properties
ABSORPTION
AMORPHOUS STATE
ANGULAR MOMENTUM
CHEMICAL BONDS
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
DATA
DIMENSIONS
DOPED MATERIALS
ENERGY LEVELS
EXPERIMENTAL DATA
FILMS
HYDRIDES
HYDROGEN COMPOUNDS
INFORMATION
INTERFACES
LAYERS
MATERIALS
NUMERICAL DATA
OPTICAL PROPERTIES
PARTICLE PROPERTIES
PHYSICAL PROPERTIES
SILANES
SILICON COMPOUNDS
SPECTRA
SPECTROSCOPY
SPIN
SURFACES
THICKNESS
WAVELENGTHS