Effects of device scaling and geometry on MOS radiation hardness assurance
Conference
·
OSTI ID:6620762
MOS total-dose response is shown to depend strongly on transistor gate length. Simple scaling models cannot predict short-channel device response from long-channel results. Hardness assurance implications are discussed for weapon and space environments.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (United States)
- Sponsoring Organization:
- DOE; DOD; USDOE, Washington, DC (United States); Department of Defense, Washington, DC (United States)
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 6620762
- Report Number(s):
- SAND-93-0531C; CONF-930704--6; ON: DE93009832
- Country of Publication:
- United States
- Language:
- English
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Effects of device scaling and geometry on MOS radiation hardness assurance
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Sun Feb 28 23:00:00 EST 1993
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Effects of device scaling and geometry on MOS radiation hardness assurance
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Related Subjects
42 ENGINEERING
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
45 MILITARY TECHNOLOGY, WEAPONRY, AND NATIONAL DEFENSE
450200 -- Military Technology
Weaponry
& National Defense-- Nuclear Explosions & Explosives
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ANNEALING
ELECTRIC POTENTIAL
HARDENING
HEAT TREATMENTS
IRRADIATION
MOS TRANSISTORS
NUCLEAR WEAPONS
PHYSICAL RADIATION EFFECTS
QUALITY ASSURANCE
RADIATION EFFECTS
RADIATION HARDENING
SEMICONDUCTOR DEVICES
SPACE
TRANSISTORS
WEAPONS
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
45 MILITARY TECHNOLOGY, WEAPONRY, AND NATIONAL DEFENSE
450200 -- Military Technology
Weaponry
& National Defense-- Nuclear Explosions & Explosives
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ANNEALING
ELECTRIC POTENTIAL
HARDENING
HEAT TREATMENTS
IRRADIATION
MOS TRANSISTORS
NUCLEAR WEAPONS
PHYSICAL RADIATION EFFECTS
QUALITY ASSURANCE
RADIATION EFFECTS
RADIATION HARDENING
SEMICONDUCTOR DEVICES
SPACE
TRANSISTORS
WEAPONS