Submicron, soft x-ray fluorescence imaging
- AT T Bell Laboratories, 510E Brookhaven National Laboratory, Upton, New York 11973 (United States)
- AT T Bell Laboratories, Murray Hill, New Jersey 07974 (United States)
- AT T Bell Laboratories, Holmdel, New Jersey 07733 (United States)
- National Synchrotron Light Source, 725D Brookhaven National Laboratory, Upton, New York 11973 (United States)
Submicron fluorescence imaging of soft x-ray aerial images, using a high resolution fluorescent crystal is reported. Features as small as 0.1 [mu]m were observed using a commercially available single-crystal phosphor, STI-F10G (Star Tech Instruments Inc. P. O. Box 2536, Danbury, CT 06813-2536), excited with 139 A light. Its quantum efficiency was estimated to be 5--10 times that of sodium salicylate and to be constant over a broad spectral range from 30 to 400 A. A comparison with a terbium-activated yttrium orthosilicate fluorescent crystal is also presented. Several applications, such as the characterization of the aerial images produced by deep ultraviolet or extreme ultraviolet lithographic exposure tools, are envisaged.
- OSTI ID:
- 6619776
- Journal Information:
- Applied Physics Letters; (United States), Journal Name: Applied Physics Letters; (United States) Vol. 66:3; ISSN APPLAB; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
400101* -- Activation
Nuclear Reaction
Radiometric & Radiochemical Procedures
CHEMICAL ANALYSIS
CRYSTALS
ELECTROMAGNETIC RADIATION
IONIZING RADIATIONS
MICROSCOPY
MONOCRYSTALS
NONDESTRUCTIVE ANALYSIS
PHOSPHORS
RADIATIONS
RESOLUTION
SOFT X RADIATION
SPATIAL RESOLUTION
X RADIATION
X-RAY EMISSION ANALYSIS
X-RAY FLUORESCENCE ANALYSIS