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Charge separation in bipolar transistors

Conference ·
OSTI ID:6618509
; ;  [1];  [2];  [3]
  1. Arizona Univ., Tucson, AZ (United States). Dept. of Electrical and Computer Engineering
  2. Naval Surface Warfare Center, Crane, IN (United States)
  3. Sandia National Labs., Albuquerque, NM (United States)
The effects of the midgap-level interface trap density and net oxide charge on the total-dose gain degradation of a bipolar transistor are separately identified. The superlinear dose dependence of the excess base current is explained.
Research Organization:
Sandia National Labs., Albuquerque, NM (United States)
Sponsoring Organization:
DOE; USDOE, Washington, DC (United States)
DOE Contract Number:
AC04-76DP00789
OSTI ID:
6618509
Report Number(s):
SAND-93-0381C; CONF-930704--4; ON: DE93009624
Country of Publication:
United States
Language:
English

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