Applications of synchrotron x-ray diffraction topography to fractography

Conference · Sat Jan 01 00:00:00 EST 1983

OSTI ID:6612477

Bilello, J C

Fractographs have been taken using a variety of probes each of which produces different types of information. Methods which have been used to examine fracture surfaces include: (a) optical microscopy, particularly interference contrast methods, (b) scanning electron microscopy (SEM), (c) SEM with electron channelling, (d) SEM with selected-area electron channelling, (e) Berg-Barrett (B-B) topography, and now (f) synchrotron x-radiation fractography (SXRF). This review concentrated on the role that x-ray methods can play in such studies. In particular, the ability to nondestructively assess the subsurface microstructure associated with the fracture to depths of the order of 5 to 10 ..mu..m becomes an important attribute for observations of a large class of semi-brittle metals, semiconductors and ceramics.

• Research Organization: State Univ. of New York, Stony Brook (USA). Dept. of Materials Science and Engineering
• DOE Contract Number: FG02-84ER45098
• OSTI ID: 6612477
• Report Number(s): DOE/ER/45098-2; CONF-830887-5; ON: DE84016257
• Resource Relation: Conference: Joint meeting of American Crystallographic Association and Denver X-ray conference, Snowmass, CO, USA, 1 Aug 1983; Other Information: Portions are illegible in microfiche products
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
36 MATERIALS SCIENCE
FRACTOGRAPHY
X-RAY DIFFRACTION
MOLYBDENUM
NIOBIUM
SYNCHROTRON RADIATION
BREMSSTRAHLUNG
COHERENT SCATTERING
DIFFRACTION
ELECTROMAGNETIC RADIATION
ELEMENTS
METALS
RADIATIONS
SCATTERING
TRANSITION ELEMENTS
420500* - Engineering- Materials Testing
360103 - Metals & Alloys- Mechanical Properties