skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Crack-tip microstructure of elastic-plastic crystals using SXRF

Conference · · TMS (The Metallurgical Society) Paper Selection; (USA)
OSTI ID:5310192
 [1]
  1. New York State Univ., Stony Brook (USA)

Synchrotron x-ray fractography (SXRF) uses white beam synchrotron radiation in a special reflection mode to study the morphology of cleavage surfaces. The method is rapid, non-destructive and allows quantitative assessment of the sub-face microstructure associated with elastic-plastic crack initiation and propagation. Studies using SXRF are compared with other methods of fractography; e.g. optical, SEM, and Berg-Barrett x-ray topography. Studies of the plastic relaxation zones developed from precursor cracks in Mo, Nb, Mo-Nb alloys, Zn, and Zn-Cd alloys are described. Techniques for analyzing the image contrast for SXRF data in terms of deformation microstructure are presented. Results indicate that different mechanisms pertain for cleavage failure in the presence of a sharp notch for Nb when contrasted to Mo. Further, that large changes in cleavage energies for alloys cannot always be rationalized in terms of surface energy arguments, but rather must be considered in relation to changes in deformation modes at the crack-tip.

OSTI ID:
5310192
Report Number(s):
CONF-840909-; CODEN: TMPSA
Journal Information:
TMS (The Metallurgical Society) Paper Selection; (USA), Vol. 56; Conference: TMS-AIME fall meeting, Detroit, MI (USA), 16-20 Sep 1984; ISSN 0197-1689
Country of Publication:
United States
Language:
English