SXRF studies of bulk crack-tip plastic relaxation

Conference · Tue Jan 01 00:00:00 EST 1985

OSTI ID:5274503

Bilello, J C

Synchrotron x-ray fractography (SXRF) has been developed as a non-destructive probe of the plastic relaxation zone accompanying bulk fracture in semi-brittle crystals. This method uses white beam synchrotron x-radiation impinging on the cleavage surface of a fractured sample at grazing angle incidence. Topographs are collected in the 2theta = 90/sup 0/ with information obtained about the bulk microstructure down to the first extinction depth, i.e., approximately 5 to 10 micrometers below the surface. In comparison with other fractography methods such as, Berg-Barrett topography, optical and Scanning Electron Microscopy, SXRF offers some unique advantages. These include the ability to assess the bulk microstructure associated with crack initiation and propagation coupled with extremely high data collection rates. SXRF data taken at Daresbury, UK, Stanford SSRL and Brookhaven NSLS will be compared with the more conventional fractography methods. 4 refs., 1 fig. 1 tab.

• Research Organization: State Univ. of New York, Stony Brook (USA). Dept. of Materials Science and Engineering
• DOE Contract Number: FG02-84ER45098
• OSTI ID: 5274503
• Report Number(s): DOE/ER/45098-10; CONF-851104-1; ON: DE85018013
• Resource Relation: Conference: Fundamental aspects of fracture, Gatlinburg, TN, USA, 4 Nov 1985
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CADMIUM ALLOYS
CRACKS
MOLYBDENUM
MOLYBDENUM ALLOYS
NIOBIUM
NIOBIUM ALLOYS
ZINC
ZINC ALLOYS
DISLOCATIONS
FRACTOGRAPHY
PLASTICITY
SYNCHROTRON RADIATION
ALLOYS
BREMSSTRAHLUNG
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
ELECTROMAGNETIC RADIATION
ELEMENTS
LINE DEFECTS
MECHANICAL PROPERTIES
METALS
RADIATIONS
TRANSITION ELEMENTS
360103* - Metals & Alloys- Mechanical Properties