A high resolution TDC subsystem

Conference · Tue Feb 01 04:00:00 EST 1994 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:6598349

Geiges, R; Merle, K ^[1]

---

1. Mainz Univ. (Germany)

A high resolution TDC subsystem was developed at the Institute for Nuclear Physics in Mainz. The TDC chip offers a time resolution of less than 300 ps and a programmable measurement range from 0 to 16 [mu]sec. The time measurement is done with a new, purely digital counting method. The chip can be operated in common start or common stop mode. In common start mode the chip is able to store up to 4 multiple hits per channel. The chip is used to build a transputer controlled subsystem for the measurement of the drift times of a vertical drift chamber. The design of the subsystem will be described and the first results from the tests of the prototype system will be presented.

• OSTI ID: 6598349
• Report Number(s): CONF-930640--
• Conference Information: Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 41:1Pt1
• Country of Publication: United States
• Language: English

Related Subjects

440104* -- Radiation Instrumentation-- High Energy Physics Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ANALOG-TO-DIGITAL CONVERTERS
DESIGN
DRIFT CHAMBERS
ELECTRONIC EQUIPMENT
EQUIPMENT
MEASURING INSTRUMENTS
MODULAR STRUCTURES
MULTIWIRE PROPORTIONAL CHAMBERS
PERFORMANCE
PERFORMANCE TESTING
PROPORTIONAL COUNTERS
RADIATION DETECTORS
TESTING
TIME MEASUREMENT