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Secondary fluorescence effects on x-ray microanalysis. [TiB/sub 2/ with Ni additive]

Conference ·
OSTI ID:6597439
The structure and composition of intergranular phases present in TiB/sub 2/ hot-pressed or sintered with Ni additive are being analyzed to evaluate sintering mechanisms. Analytical electron microscopy (AEM) has shown that the major intergranular phase present in TiB/sub 2/ hot-pressed with Ni is Ni/sub 3/B, but in TiB/sub 2/ sintered with Ni is a boride tau phase. Energy dispersive x-ray spectroscopy (EDS) of the intergranular Ni/sub 3/B indicated a normalized Ti content of approx. 8 at. %. However, phase diagram data show Ni/sub 3/B to be a line compound with limited Ti solubility. The present experiments were performed to assess the suspected influence of secondary fluorescence effects on EDS analyses.
Research Organization:
Oak Ridge National Lab., TN (USA)
DOE Contract Number:
AC05-84OR21400
OSTI ID:
6597439
Report Number(s):
CONF-840848-7; ON: DE84016600
Country of Publication:
United States
Language:
English

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