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Secondary fluorescence effects on x-ray microanalysis

Journal Article · · Proc. - Annu. Meet., Electron Microsc. Soc. Am.; (United States)
OSTI ID:5907667

The structure and composition of intergranular phases present in TiB/sub 2/ hot-pressed or sintered with Ni additive are being analyzed to evaluate sintering mechanisms. Analytical electron microscopy (AEM) has shown that the major intergranular phase present in TiB/sub 2/ hot-pressed with Ni is Ni/sub 3/B, but in TiB/sub 2/ sintered with Ni is a boride tau phase. Energy dispersive x-ray spectroscopy (EDS) of the intergranular Ni/sub 3/B indicated a Ti content of approx. 8 at. % (all compositions quoted are normalized where at % Ti + at % Ni = 100%). However, phase diagram data show Ni/sub 3/B to be a line compound with limited Ti solubility. The experiments were performed to assess the suspected influence of secondary fluorescence effects on EDS analyses.

Research Organization:
Oak Ridge National Lab., TN
DOE Contract Number:
AC05-84OR21400
OSTI ID:
5907667
Journal Information:
Proc. - Annu. Meet., Electron Microsc. Soc. Am.; (United States), Journal Name: Proc. - Annu. Meet., Electron Microsc. Soc. Am.; (United States) Vol. 42; ISSN EMSPA
Country of Publication:
United States
Language:
English