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American Vacuum Society, National Symposium, 36th, Boston, MA, Oct. 23-27, 1989, Proceedings. Parts 1 2

Conference · · Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (USA)
OSTI ID:6594166

The present conference discusses sputtering and bombardment effects in thin films, process property relationships, thin films for magnetic, optical, ferroelectric, and piezoelectric applications, CVD and activated vapor deposition processes, cluster ion beam deposition, thin film interconnects and packaging, thin film deposition and characterization, the mechanisms of nucleation, epitaxy, and growth, laser deposition and processing, plasma modeling, plasma etching, inertial confinement plasma technology, electron cyclotron resonance, modulated plasma processing, the oxidation and nitridation of semiconductors, metal-semiconductor interfaces, composite interfaces, diamond and diamondlike films, and ion-assisted deposition and surface modification. Also discussed are chemical effects in electron spectroscopy, polymer surfaces and interfaces, adsorption and desorption, surface atomic and electronic structures, vacuum pumps, electron cyclotron resonance plasmas, epitaxy and chemical growth techniques, and heterojunctions and superlattices.

OSTI ID:
6594166
Report Number(s):
CONF-891093--
Journal Information:
Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (USA), Journal Name: Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (USA) Vol. 8; ISSN 0734-2101; ISSN JVTAD
Country of Publication:
United States
Language:
English

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