Fault-model development for fault-tolerant VLSI design. Final technical report, May 1986-May 1987

Technical Report · Sun May 01 04:00:00 EDT 1988

OSTI ID:6579670

Hartmann, C R; Lala, P K; Ali, A M; Visweswaran, G S; Ganguly, S

Fault models provide systematic and precise representations of physical defects in microcircuits in a form suitable for simulation and test generation. The current difficulty in testing VLSI circuits can be attributed to the tremendous increase in design complexity and the inappropriateness of traditional stuck-at fault models. This report develops fault models for three different types of common defects that are not accurately represented by the stuck-at fault model. The faults examined in this report are: bridging faults, transistor stuck-open faults, and transient faults caused by alpha-particle radiation. A generalized fault model could not be developed for the three fault types. However, microcircuit behavior and fault-detection strategies are described for the bridging, transistor stuck-open, and transient (alpha-particle strike) faults. The results of this study can be applied to the simulation and analysis of faults in fault-tolerant VLSI circuits.

• Research Organization: Philadelphia Dept. of Public Property, PA (USA)
• OSTI ID: 6579670
• Report Number(s): AD-A-199350/0/XAB
• Country of Publication: United States
• Language: English

Related Subjects

99 GENERAL AND MISCELLANEOUS
990210* -- Supercomputers-- (1987-1989)
ALPHA PARTICLES
BRIDGES
CHARGED PARTICLES
COMPUTERS
DETECTION
DIGITAL COMPUTERS
DOCUMENT TYPES
ELECTRONIC CIRCUITS
FAULT TOLERANT COMPUTERS
FAULT TREE ANALYSIS
INTEGRATED CIRCUITS
MECHANICAL STRUCTURES
MICROELECTRONIC CIRCUITS
PHYSICAL PROPERTIES
PROGRESS REPORT
SIMULATION
SYSTEM FAILURE ANALYSIS
SYSTEMS ANALYSIS
TRANSIENTS