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Total dose effects on negative voltage regulator

Conference · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:6559236
; ; ;  [1]
  1. Matra Marconi Space, Velizy Villacoublay (France)
Functional failure at low dose level (4 Krad(Si)) on voltage regulators (LM137) from different manufacturers are analyzed. Dose rate effects on parts hardness are evaluated, showing that lowering the dose rate degrade more the IC's in the range 55 rad(Si)/s--0,8 rad(Si)/s. A failure mechanism is proposed, mainly based on circuit analysis, voltage contrast measurements, local irradiation and local electrical measurements with probe station. A SPICE simulation was performed, providing quantitative information on the degradation. In the light of such a failure analysis and dose rate effects, practical implications on radiation assurance are discussed.
OSTI ID:
6559236
Report Number(s):
CONF-940726--
Conference Information:
Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 41:6Pt1
Country of Publication:
United States
Language:
English