An attempt to define conservative conditions for total dose evaluation of bipolar ICs

Journal Article · Mon Dec 01 04:00:00 EST 1997 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/23.658972· OSTI ID:644192

Bonora, L; David, J P ^[1]

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1. DERTS, Toulouse (France)

This paper investigates the influence of parameters such as temperature, dose rate and bias upon the degradation of irradiated bipolar commercial ICs (LM124 operational amplifiers and LM139 comparators). Results at 0.003 rad(Si)/s are included and compared with high dose rate irradiations at elevated temperature or combining an elevated temperature and a reverse bias applied to the supply pins of the device. The damage levels reached appear reasonably close to the data at very low dose rate for the tested devices. These preliminary results may contribute to the development of a hardness assurance test method.

• Sponsoring Organization: Centre National d`Etudes Spatiales (CNES), 75 - Paris (France)
• OSTI ID: 644192
• Report Number(s): CONF-970711--
• Journal Information: IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 6Pt1 Vol. 44; ISSN 0018-9499; ISSN IETNAE
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
INTEGRATED CIRCUITS
IONIZING RADIATIONS
PHYSICAL RADIATION EFFECTS
RADIATION DOSES
TEMPERATURE DEPENDENCE
TESTING