Estimation of 1-MeV equivalent neutron fluence from dosimetry response without spectrum unfolding

Conference · Wed Nov 30 23:00:00 EST 1994 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:6559002

Williams, J G; Figueroa, J T ^[1]; Griffin, P J; Kelly, J G ^[2]

---

1. Univ. of Arizona, Tucson, AZ (United States)
2. Sandia National Labs., Albuquerque, NM (United States)

Estimation of 1-MeV equivalent neutron fluence is usually accomplished by means of neutron spectrum adjustment based on dosimetry measurements using radiometric monitors (activation foils). If it is true that prior spectrum knowledge is unnecessary to obtain 1-MeV equivalent neutron fluence ([Phi][sub 1-MeV]) from dosimetry measurements, then it must be possible to represent [Phi][sub 1-Mev] as a linear function of the measured reaction probabilities. This is true because both [Phi][sub 1-MeV] and the reaction probabilities are linear functions of the energy-dependent fluence spectrum. A new methodology for determining the appropriate linear mapping from dosimetry measurements to damage responses such as silicon displacement damage is presented in this paper. The method is based on standard methods of linear algebra and linear regression. A method having some features in common with this work was previously implemented by Stallman et al. The new methodology, referred to here as the projection methodology, has been tested by applying it to a variety of neutron fields at the Sandia National Laboratories reactors ACRR and SPR-III. These fields have been previously characterized for radiation hardness testing of electronics using the ASTM E722 methodology.

• OSTI ID: 6559002
• Report Number(s): CONF-940726--
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 41:6Pt1; ISSN 0018-9499; ISSN IETNAE
• Country of Publication: United States
• Language: English

Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DAMAGING NEUTRON FLUENCE
ELECTRONIC EQUIPMENT
ELEMENTS
EQUIPMENT
NEUTRON FLUENCE
NEUTRON SPECTRA
PHYSICAL RADIATION EFFECTS
PROBABILISTIC ESTIMATION
RADIATION EFFECTS
SEMIMETALS
SILICON
SPECTRA