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Soft-x-ray investigation of Mg and Al oxides: Evidence for atomic and bandlike features

Journal Article · · Physical Review, B: Condensed Matter; (United States)
; ; ;  [1]; ;  [2];  [3]
  1. University of Tennessee, Knoxville, Tennessee 37996 (United States)
  2. National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
  3. Brookhaven National Laboratory, Upton, New York 11973 (United States)
Soft-x-ray emission (SXE) and soft-x-ray absorption (SXA) are used to investigate the electronic structure of [alpha]-Al[sub 2]O[sub 3], anodized Al[sub 2]O[sub 3], MgO, and MgAl[sub 2]O[sub 4]. It is found that both SXE and SXA are sensitive to the crystal phase, suggesting their use as a structural probe. Comparison of the Al [ital L][sub 2,3] SXE of [alpha]-Al[sub 2]O[sub 3] and the Mg [ital L][sub 2,3] SXE of MgO with local-density-approximation (LDA) density-of-states calculations shows that the agreement is good, and suggests that the final-state rule is valid for the SXE of these oxides. On the other hand, comparisons show that results of the SXA and LDA calculations are not in good agreement. A model based on atomiclike excitations explains a portion of the MgO SXA spectrum well. Evidence which suggests that the remaining features are due to band structure is given.
OSTI ID:
6542482
Journal Information:
Physical Review, B: Condensed Matter; (United States), Journal Name: Physical Review, B: Condensed Matter; (United States) Vol. 47:23; ISSN PRBMDO; ISSN 0163-1829
Country of Publication:
United States
Language:
English