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L/sub 23/ soft-x-ray emission and absorption spectra of Na

Journal Article · · Phys. Rev., B; (United States)
The L/sub 23/ soft-x-ray emission (SXE) and soft-x-ray absorption (SXA) edges have been measured. The SXE edges were measured at temperatures between 85 and 380 K, and analyzed to obtain edge positions and widths. The widths increased from GAMMA/sub SXE/ = 100 meV at 85 K to 150 meV at 320 K and to 180 meV above the melting point at 380 K. Both SXE and SXA edges were measured at 100 K with the same spectrometer, and the data were analyzed to obtain values of the edge widths (GAMMA/sub SXE/ = 100 meV and GAMMA/sub SXA/ = 64 meV), of the many-body peaking parameter (..cap alpha../sub SXE/ = 0.15 and ..cap alpha../sub SXA/ = 0.24), of the gap between the edges (E/sub g/ = 74 meV), and of the excess width of the emission edge ((..delta..GAMMA)/sup 2/ = GAMMA/sup 2//sub SXE/ - GAMMA/sup 2//sub SXA/ = 5900 (meV)/sup 2/). The values of E/sub g/ and (..delta..GAMMA)/sup 2/ were used in the partial-lattice-relaxation theory of Almbladh to obtain a value of the core-hole lifetime broadening (GAMMA/sub 2p/ = 10 meV). We conclude that structure in the transition density of states, many-body effects, and lattice relaxation all have important effects on the edge structure, and suggest that rounding of the SXE edge by partial relaxation accounts for the smaller peaking parameter obtained from the SXE data as compared to the SXA data.
Research Organization:
Health and Safety Research Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37830
OSTI ID:
6349340
Journal Information:
Phys. Rev., B; (United States), Journal Name: Phys. Rev., B; (United States) Vol. 18:12; ISSN PLRBA
Country of Publication:
United States
Language:
English