Single event upset at gigahertz frequencies
Conference
·
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:6488807
- Hughes Space and Communications, Los Angeles, CA (United States)
- Smith (E.), Monteagle, TN (United States)
- Aerospace Corp., El Segundo, CA (United States)
Single Event Upset (SEU) characteristics of a digital emitter coupled logic (ECL) device clocking at 0.5, 1, and 3.2 GHz and at temperatures of 5, 75, and 105 C are presented. The test technique is explained. Observations of two types of upsets, phase upsets at low Linear Energy Transfer (LETs) and amplitude upsets at high LETs are also presented. The cause of phase upsets is discussed. The effect of each type of upset on the system is discussed. The upset cross section and LET threshold seem to be insensitive to temperatures below 75 C and to the clock frequencies tested.
- OSTI ID:
- 6488807
- Report Number(s):
- CONF-940726--
- Conference Information:
- Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 41:6Pt1
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHARGED PARTICLES
DATA
DIGITAL SYSTEMS
ELECTRONIC CIRCUITS
ERRORS
EXPERIMENTAL DATA
INFORMATION
IONS
LOGIC CIRCUITS
NUMERICAL DATA
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
TEMPERATURE RANGE
TEMPERATURE RANGE 0273-0400 K
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CHARGED PARTICLES
DATA
DIGITAL SYSTEMS
ELECTRONIC CIRCUITS
ERRORS
EXPERIMENTAL DATA
INFORMATION
IONS
LOGIC CIRCUITS
NUMERICAL DATA
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
TEMPERATURE RANGE
TEMPERATURE RANGE 0273-0400 K