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Critical current behavior and oxide barrier properties of Ta surface layers on Nb

Conference · · IEEE Trans. Magn.; (United States)
OSTI ID:6485923

The authors have investigated the critical current, I /SUB c/ R, and oxide barrier shape in Nb/Ta/Ox/C.E. tunnel junctions. Here, layers of Ta in the thickness range O

Research Organization:
University of Notre Dame, Notre Dame, IN
OSTI ID:
6485923
Report Number(s):
CONF-840937-
Journal Information:
IEEE Trans. Magn.; (United States), Journal Name: IEEE Trans. Magn.; (United States) Vol. MAG-21:2; ISSN IEMGA
Country of Publication:
United States
Language:
English