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A new scaling relation for sputtered NbN films

Technical Report ·
OSTI ID:6482813
We have discovered a scaling relation connecting the properties of NbN films made at different sputtering rates. For a given sputtering rate, as a function of increasing argon partial pressure (P/sub Ar/) we observe a linear reduction of T/sub c/ and a rapid increase in H/sub c2/ (4.2 K) followed by saturation. This produces a maximum in J/sub c/ (measured at 19 T and 4.2 K) vs P/sub Ar/. Films having similar high field superconducting properties (H/sub c2/ and J/sub c/) and microstructures can be made at higher sputtering rates (> 60 /angstrom//s) if a higher argon gas pressure is used. A simple scale factor determines the argon pressure necessary. This scaling relation may provide some insight into those factors in the sputtering process which are important in determining the superconducting properties and microstructure of sputtered NbN films. 10 refs., 2 figs.
Research Organization:
Argonne National Lab., IL (USA)
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
6482813
Report Number(s):
ANL/PPRNT-89-145; ON: DE89008349
Country of Publication:
United States
Language:
English