Attenuation of single event induced pulses in CMOS combinational logic
Journal Article
·
· IEEE Transactions on Nuclear Science
- Boeing Defense and Space Group, Seattle, WA (United States)
- SFA Inc., Landover, MD (United States)
Results are presented of a study of SEU generated transient pulse attenuation in combinational logic structures built using common digital CMOS design practices. SPICE circuit analysis, heavy ion tests, and pulsed, focused laser simulations were used to examine the response characteristics of transient pulse behavior in long logic strings. Results show that while there is an observable effect, it cannot be generally assumed that attenuation will significantly reduce observed circuit bit error rates.
- OSTI ID:
- 644212
- Report Number(s):
- CONF-970711--
- Journal Information:
- IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 6Pt1 Vol. 44; ISSN 0018-9499; ISSN IETNAE
- Country of Publication:
- United States
- Language:
- English
Similar Records
Upset due to a single particle caused propagated transients in a bulk CMOS microprocessor
Single event upsets in gallium arsenide dynamic logic
Simulation of SEU transients in CMOS ICs
Conference
·
Sat Nov 30 23:00:00 EST 1991
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
·
OSTI ID:5612361
Single event upsets in gallium arsenide dynamic logic
Conference
·
Wed Nov 30 23:00:00 EST 1994
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
·
OSTI ID:6488790
Simulation of SEU transients in CMOS ICs
Conference
·
Sat Nov 30 23:00:00 EST 1991
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
·
OSTI ID:5832205