Comparison of error rates in combinational and sequential logic

Journal Article · Mon Dec 01 04:00:00 EST 1997 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/23.659037· OSTI ID:644211

Buchner, S ^[1]; Brown, D; McMorrow, D; Melinger, J ^[2]; Baze, M ^[3]

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1. SFA Inc., Largo, MD (United States)
2. NRL, Washington, DC (United States)
3. Boeing Defense and Space Group, Seattle, WA (United States)

A pulsed laser was used to demonstrate that, for transients much shorter than the clock period, error rates in sequential logic were independent of frequency, whereas error rates in combinational logic were linearly dependent on frequency. In addition, by measuring the error rate as a function of laser pulse energy for fixed clock frequency, the logarithmic dependence of the single event upset (SEU) vulnerable time period prior to the clock edge in combinational logic was established. A mixed mode circuit simulator program was used to successfully model the dynamic response of the logic circuit to pulses of laser light.

• OSTI ID: 644211
• Report Number(s): CONF-970711--
• Journal Information: IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 6Pt1 Vol. 44; ISSN 0018-9499; ISSN IETNAE
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
DIAGNOSTIC TECHNIQUES
ERRORS
LASER RADIATION
LOGIC CIRCUITS
PHYSICAL RADIATION EFFECTS
SIMULATION