Analysis of single event effects at grazing angle

Journal Article · Mon Jun 01 00:00:00 EDT 1998 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/23.685247· OSTI ID:644167

Campbell, A B ^[1]; Musseau, O; Ferlet-Cavrois, V ^[2]; Stapor, W J; McDonald, P T ^[3]

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1. Naval Research Lab., Washington, DC (United States)
2. CEA, Bruyeres le Chatel (France)
3. ICI, McLean, VA (United States)

When a single high energy ion interacts with an integrated circuit at grazing angle, several sensitive volumes may interact with the ionization track along its trajectory. This can result in single event effects (SEE) in more than one cell or node. These multiple bit upsets (MBU) have been previously reported. In this work the authors define a MBU track to be a number of single event upsets (SEU`s) greater than two along a straight line in a row or column of the device. The authors present and discuss new experimental data at grazing angle (MBU and charge collection (CC) spectra) on different technologies using high energy, heavy ions. The results relate to intra-cell charge collection phenomena as contrasted with previous work which dealt with intercell effects.

• OSTI ID: 644167
• Report Number(s): CONF-970934--
• Journal Information: IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 3Pt3 Vol. 45; ISSN 0018-9499; ISSN IETNAE
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
CHARGE COLLECTION
ERRORS
HEAVY IONS
INCIDENCE ANGLE
INTEGRATED CIRCUITS
PHYSICAL RADIATION EFFECTS