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Dispersion of the refractive index near the absorption edge in compound semiconductors

Technical Report ·
OSTI ID:6435625
An analytical expression for the real part of the refractive index n near the fundamental absorption edge has been calculated for a semiconductor in terms of experimentally known quantities. It is derived from a quantum mechanical calculation of the complex dielectric constant which assumes the band structure of the Kane theory. The expression obtained is a function of band gap energy, effective electron and heavy hole masses, the spin orbit splitting energy, the lattice constant, and the carrier concentration for n-type or p-type materials. The refractive index is given as a function of frequency and the basic material parameters listed above with no adjustable constants. Dispersion near the fundamental absorption edge, which has been observed experimentally for a number of III-V and II-VI compounds, is predicted and its calculation enabled. Comparison of theory with available experimental data is given.
Research Organization:
Boston Univ., MA (USA). Dept. of Physics
DOE Contract Number:
AC02-79ER10444
OSTI ID:
6435625
Report Number(s):
DOE/ER/10444-7; CONF-821170-1; ON: DE83007501
Country of Publication:
United States
Language:
English