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Nonaqueous chemical depth profiling of YBa/sub 2/Cu/sub 3/O/sub 7//sub -//sub x/

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.101425· OSTI ID:6420047
A nonaqueous solution of Br in absolute ethanol (EtOH) has recently been reported (R. P. Vasquez, B. D. Hunt, and M. C. Foote, Appl. Phys. Lett. 53, 2692 (1988)) to be effective at removing nonsuperconducting surface species from YBa/sub 2/ Cu/sub 3/ O/sub 7-//sub x/ films, leaving the surface close to the ideal stoichiometry. This same etchant is shown here to be an effective bulk etchant in chemical depth profiling through 1-..mu..m-thick films. The Cu remains in the 2+oxidation state and the stoichiometry, as determined by x-ray photoelectron spectroscopy, is close to ideal and nearly constant throughout the profile, indicating the absence of any large preferential etching effects. The reaction of YBa/sub 2/ Cu/sub 3/ O/sub 7-//sub x/ films with HF/EtOH, HCl/ EtOH, and I/EtOH solutions is also reported.
Research Organization:
Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91109
OSTI ID:
6420047
Journal Information:
Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 54:11; ISSN APPLA
Country of Publication:
United States
Language:
English