A multi-sample Cs-sputter negative-ion source
Conference
·
· AIP Conference Proceedings
OSTI ID:6417820
- Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37831-6368 (United States)
A multi-sample Cs sputter negative-ion source, equipped with a conical-geometry, W-surface-ionizer has been designed and fabricated that permits sample changes without disruption of on-line accelerator operation. Sample changing is effected by actuating an electro-pneumatic control system located at ground potential that drives an air-motor-driven sample-indexing-system mounted at high voltage; this arrangement avoids complications associated with indexing mechanisms that rely on electronic power-supplies located at high potential. In-beam targets are identified by LED indicator lights derived from a fiber-optic, Gray-code target-position sensor. Aspects of the overall source design and details of the indexing mechanism along with operational parameters, ion optics, intensities, and typical emittances for a variety of negative-ion species will be presented in this report. [copyright] [ital 1999 American Institute of Physics.]
- DOE Contract Number:
- AC05-96OR22464
- OSTI ID:
- 6417820
- Report Number(s):
- CONF-981087--
- Conference Information:
- Journal Name: AIP Conference Proceedings Journal Volume: 473:1
- Country of Publication:
- United States
- Language:
- English
Similar Records
A Multi-Sample Cs-Sputter Negative Ion Source
A multi-sample Cs-sputter negative-ion source
A multiple-sample, cesium-sputter, negative ion source
Conference
·
Mon Oct 05 00:00:00 EDT 1998
·
OSTI ID:3739
A multi-sample Cs-sputter negative-ion source
Journal Article
·
Mon Apr 26 00:00:00 EDT 1999
· AIP Conference Proceedings
·
OSTI ID:21205472
A multiple-sample, cesium-sputter, negative ion source
Journal Article
·
Tue Mar 31 23:00:00 EST 1992
· Review of Scientific Instruments; (United States)
·
OSTI ID:7280443