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A multiple-sample, cesium-sputter, negative ion source

Journal Article · · Review of Scientific Instruments; (United States)
DOI:https://doi.org/10.1063/1.1142907· OSTI ID:7280443
 [1]
  1. Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, Tennessee 37831-6368 (United States)
A multiple-sample, cesium-sputter, negative-ion source which permits sample changes without disruption of on-line tandem electrostatic accelerator operations is described. The source is equipped with provisions for remotely selecting and moving into the beam position any one of 60 samples by means of stepping motors equipped with absolute shaft encoders. A spherical-sector cesium ionizer is used to produce the cesium beam for sputtering the sample material. The source is equipped with a three-element electrode system which has been designed to increase the perveance for cesium ion beam generation and to improve negative ion beam extraction from the source.
DOE Contract Number:
AC05-84OR21400
OSTI ID:
7280443
Journal Information:
Review of Scientific Instruments; (United States), Journal Name: Review of Scientific Instruments; (United States) Vol. 63:4; ISSN RSINA; ISSN 0034-6748
Country of Publication:
United States
Language:
English