Limitations to the application of the electron-beam-induced current in hydrogen-passivated silicon grain boundaries
Journal Article
·
· J. Appl. Phys.; (United States)
The electron-beam-induced current (EBIC) mode of a scanning electron microscope is used to investigate the effect of hydrogen passivation on silicon grain boundaries. A reduction in the grain boundary surface recombination velocity is observed by EBIC linescans after passivation. The EBIC signal decays with repeated linescans across hydrogen-passivated grain boundaries. This is probably associated with the electron-beam-induced breaking of passivated bonds in the grain boundary. Subsequent annealing at about 200 /sup 0/C restores the hydrogen passivation effect on grain boundaries.
- Research Organization:
- Solar Energy Research Institute, Golden, Colorado 80401
- OSTI ID:
- 6415740
- Journal Information:
- J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 56:10; ISSN JAPIA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
14 SOLAR ENERGY
140501* -- Solar Energy Conversion-- Photovoltaic Conversion
ANNEALING
CHEMICAL REACTIONS
CRYSTAL STRUCTURE
DIRECT ENERGY CONVERTERS
ELECTRON MICROSCOPY
ELEMENTS
EQUIPMENT
GRAIN BOUNDARIES
HEAT TREATMENTS
HYDROGENATION
MEDIUM TEMPERATURE
MICROSCOPY
MICROSTRUCTURE
PASSIVATION
PHOTOELECTRIC CELLS
PHOTOVOLTAIC CELLS
RECOMBINATION
SCANNING ELECTRON MICROSCOPY
SEMIMETALS
SILICON
SILICON SOLAR CELLS
SOLAR CELLS
SOLAR EQUIPMENT
USES
140501* -- Solar Energy Conversion-- Photovoltaic Conversion
ANNEALING
CHEMICAL REACTIONS
CRYSTAL STRUCTURE
DIRECT ENERGY CONVERTERS
ELECTRON MICROSCOPY
ELEMENTS
EQUIPMENT
GRAIN BOUNDARIES
HEAT TREATMENTS
HYDROGENATION
MEDIUM TEMPERATURE
MICROSCOPY
MICROSTRUCTURE
PASSIVATION
PHOTOELECTRIC CELLS
PHOTOVOLTAIC CELLS
RECOMBINATION
SCANNING ELECTRON MICROSCOPY
SEMIMETALS
SILICON
SILICON SOLAR CELLS
SOLAR CELLS
SOLAR EQUIPMENT
USES