Diffraction anomalous fine-structure study of strained Ga{sub 1{minus}x}In{sub x}As on GaAs(001)

Journal Article · Sat Aug 01 04:00:00 EDT 1998 · Physical Review, B: Condensed Matter

DOI:https://doi.org/10.1103/PhysRevB.58.R4215· OSTI ID:641542

Woicik, J C ^[1]; Cross, J O ^[2]; Bouldin, C E; Ravel, B; Pellegrino, J G; Steiner, B ^[1]; Bompadre, S G; Sorensen, L B ^[3]; Miyano, K E ^[4]; Kirkland, J P ^[5]

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1. National Institute of Standards and Technology, Gaithersburg, Maryland 20899 (United States)
2. Naval Research Laboratory, Washington, DC 20375 (United States)
3. Department of Physics, University of Washington, Seattle, Washington 98195 (United States)
4. Department of Physics, Brooklyn College, Brooklyn, New York 11210 (United States)
5. SFA Inc., 1401 McCormick Drive, Largo, Maryland 20774 (United States)

Diffraction anomalous fine-structure measurements performed at both the Ga and As {ital K} edges have determined the Ga-As bond length to be 2.442{plus_minus}0.005thinsp{Angstrom} in a buried, 213-{Angstrom}-thick Ga{sub 0.785}In{sub 0.215}As layer grown coherently on GaAs(001). This bond length corresponds to a strain-induced contraction of 0.013{plus_minus}0.005thinsp{Angstrom} relative to the Ga-As bond length in bulk Ga{sub 1{minus}x}In{sub x}As of the same composition. Together with recent extended x-ray-absorption fine-structure measurements performed at the In {ital K} edge [Woicik {ital et al.}, Phys. Rev. Lett. {bold 79}, 5026 (1997)], excellent agreement is found with the uniform bond-length distortion model for strained-layer semiconductors on (001) substrates. {copyright} {ital 1998} {ital The American Physical Society}

• OSTI ID: 641542
• Journal Information: Physical Review, B: Condensed Matter, Journal Name: Physical Review, B: Condensed Matter Journal Issue: 8 Vol. 58; ISSN 0163-1829; ISSN PRBMDO
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BOND LENGTHS
FINE STRUCTURE
GALLIUM ARSENIDES
INDIUM ARSENIDES
INDIUM COMPOUNDS
LAYERS
MICROSTRUCTURE
STRAINS
X-RAY DIFFRACTION
X-RAY SPECTRA