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Phase stability of ZrO/sub 2//sub -/Al/sub 2/O/sub 3/ thin films deposited by magnetron sputtering

Journal Article · · Phys. Rev. B: Condens. Matter; (United States)

Thin films of ZrO/sub 2/-Al/sub 2/O/sub 3/ were deposited on a variety of substrates by reactive magnetron sputtering. Nucleation and stability of the cubic, tetragonal, and monoclinic phases of ZrO/sub 2/ were investigated over the entire composition range. As deposited films were all amorphous. Annealing in air at temperatures up to 1000 /sup 0/C for several hours resulted in the crystallization and evolution of ZrO/sub 2/ phases. X-ray diffraction studies suggested that films with (Zr):(Al) atomic ratios up to 70:30 nucleated first with the zirconia in the cubic phase with subsequent transformation to a tetragonal phase as a function of annealing time. These results are consistent with the recent theoretical predictions that the cubic phase is unstable with respect to tetragonal and orthorhombic phases at lower temperatures. Observed decreases in volume of the monoclinic ZrO/sub 2/ phase with increasing Al/sub 2/O/sub 3/ content suggest an internal compression that reduces the volume of the monoclinic cell to that of the tetragonal unit cell, at which point the tetragonal structure is then observed.

Research Organization:
Condensed Matter Physics Branch, Condensed Matter and Radiation Science Division, Naval Research Laboratory, Washington, D.C. 20375-5000
OSTI ID:
6408430
Journal Information:
Phys. Rev. B: Condens. Matter; (United States), Journal Name: Phys. Rev. B: Condens. Matter; (United States) Vol. 39:9; ISSN PRBMD
Country of Publication:
United States
Language:
English