X-Ray fluorescence as an [ital in-situ] composition monitor during CuIn[sub x]Ga[sub 1[minus]x]Se[sub 2] deposition

Conference · Mon Mar 01 04:00:00 EST 1999 · AIP Conference Proceedings

OSTI ID:6382688

Eisgruber, I L; Wangensteen, T L ^[1]; Marshall, C; Carpenter, B ^[2]

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1. Materials Research Group, Inc., 12441 W. 49th Ave., Suite 2, Wheat Ridge, Colorado 80033-1927 (United States)
2. Lockheed Martin Astronautics, P.O. Box 179, Denver, Colorado 80201-0179 (United States)

The principles of x-ray fluorescence (XRF), and differences between the use of XRF as an [ital in-situ] composition sensor in CIGS module fabrication and the use of XRF in typical applications, are described. It is demonstrated for measurements on CIGS samples how a number of conditions, including interelement effects and composition gradients, may complicate conversion of XRF signals to composition. Factors controlling the precision of the measurement are enumerated. [copyright] [ital 1999 American Institute of Physics.]

• OSTI ID: 6382688
• Report Number(s): CONF-980935--
• Conference Information: Journal Name: AIP Conference Proceedings Journal Volume: 462:1
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360602* -- Other Materials-- Structure & Phase Studies
CHALCOGENIDES
CHEMICAL ANALYSIS
CHEMICAL COMPOSITION
CONTROL
COPPER COMPOUNDS
COPPER SELENIDES
DEPOSITION
DIRECT ENERGY CONVERTERS
ERRORS
FILMS
GALLIUM COMPOUNDS
GALLIUM SELENIDES
INDIUM COMPOUNDS
INDIUM SELENIDES
NONDESTRUCTIVE ANALYSIS
PHOTOELECTRIC CELLS
PHOTOVOLTAIC CELLS
PROCESS CONTROL
SELENIDES
SELENIUM COMPOUNDS
THIN FILMS
TRANSITION ELEMENT COMPOUNDS
X-RAY EMISSION ANALYSIS
X-RAY FLUORESCENCE ANALYSIS