X-Ray fluorescence as an in-situ composition monitor during CuIn{sub x}Ga{sub 1-x}Se{sub 2} deposition
Journal Article
·
· AIP Conference Proceedings
- Materials Research Group, Inc., 12441 W. 49th Ave., Suite 2, Wheat Ridge, Colorado 80033-1927 (United States)
The principles of x-ray fluorescence (XRF), and differences between the use of XRF as an in-situ composition sensor in CIGS module fabrication and the use of XRF in typical applications, are described. It is demonstrated for measurements on CIGS samples how a number of conditions, including interelement effects and composition gradients, may complicate conversion of XRF signals to composition. Factors controlling the precision of the measurement are enumerated.
- OSTI ID:
- 21205261
- Journal Information:
- AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 462; ISSN APCPCS; ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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