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Selective epitaxial growth of silicon carbide on SiO{sub 2} masked Si(100): The effects of temperature

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.368017· OSTI ID:636133
;  [1]; ;  [2];  [3];  [4];  [5]
  1. Department of Chemical Engineering, Kansas State University, Manhattan, Kansas 66506 (United States)
  2. Department of Mechanical Engineering, Wichita State University, Wichita, Kansas 67260 (United States)
  3. Sandia National Laboratories, Albuquerque, New Mexico 87123-0603 (United States)
  4. U.S. Air Force Laboratory, Hanscom Air Force Base, Massachusetts 01731 (United States)
  5. Center for Solid State Science, Arizona State University, Tempe, Arizona 85287-1704 (United States)

The effect of substrate temperature on the growth rate, crystal grain size, and SiO{sub 2} mask stability in the selective epitaxial growth of silicon carbide deposited from SiH{sub 4}, C{sub 2}H{sub 4}, and HCl{sub 1} on silicon dioxide masked silicon (100) was examined. Depositing at atmospheric pressure and a Cl/Si input ratio of 50 to achieve good selectivity, increasing the substrate temperature from 950 to 1000thinsp{degree}C increased the growth rate and the crystal size, and improved the film{close_quote}s surface morphology, but also enhanced the SiO{sub 2} mask degradation rate, causing a loss of selectivity for long deposition times. For prolonged deposition times at 1000thinsp{degree}C, SiC nucleation occurred at both voids formed in the mask from its reaction with the silicon substrate and on the SiO{sub 2} mask itself{emdash}a consequence of increasing oxide surface roughness.{copyright} {ital 1998 American Institute of Physics.}

OSTI ID:
636133
Journal Information:
Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 1 Vol. 84; ISSN JAPIAU; ISSN 0021-8979
Country of Publication:
United States
Language:
English

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