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Title: Analytical electron microscopy: a potential new tool in the study of materials compatibility

Technical Report ·
OSTI ID:6357491

The analytical electron microscope (AEM) is proving to be a powerful tool for the study and characterization of engineering materials including metals, ceramics and polymers. The power of this technique lies in its ability to examine materials at high spatial resolution. High resolution characterization is possible via several techniques including high resolution imaging in which features less than 1 nm can be resolved, high resolution compositional analysis by x-ray energy dispersive spectrometry and electron energy loss spectrometry in which chemical compositions can be determined from volumes less than 50 nm in diameter, and high resolution convergent beam microdiffraction in which the crystallographic nature of small volumes, less than 50 nm in diameter, of the material can be determined. With these techniques it is possible to characterize reactions within materials and between materials at a spatial scale unattainable by other analytical techniques. The basic principles of AEM are described and several examples of applications to materials discussed. Specific examples include characterization of uranium alloys, analysis of hot-cracking failures in austenitic stainless steel weldment heat affected zones, and diffusion in refractory metal alloys.

Research Organization:
Sandia National Labs., Albuquerque, NM (USA)
DOE Contract Number:
AC04-76DP00789
OSTI ID:
6357491
Report Number(s):
SAND-84-1422; ON: DE85003271
Resource Relation:
Other Information: Portions are illegible in microfiche products. Original copy available until stock is exhausted
Country of Publication:
United States
Language:
English