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Large differences of critical current density in thin films of superconducting YBa/sub 2/Cu/sub 3/O/sub 7-//sub x/

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.343212· OSTI ID:6336882
Thin films of YBa/sub 2/ Cu/sub 3/ O/sub 7-//sub x/ with three types of c-axis alignment have been prepared by evaporation: unaligned films on oxidized silicon with zero-resistance transition temperatures as high as 88 K (the highest value reported for thin films of this superconductor on this substrate), films with regions aligned along each of the three <100> directions of the (100) SrTiO/sub 3/ substrate, and films with the c-axis perpendicular to the (100) SrTiO/sub 3/ plane. Typical values of critical current density (A cm /sup -2/ ) at 77 K are 10/sup 2/ , 3 x 10/sup 4/ , and 10/sup 6/, respectively. The temperature dependence of the critical current density is similar for the three types of films; it increases linearly with decreasing temperature, which is suggestive of a flux creep-limited model.
Research Organization:
GE Research and Development Center, Schenectady, New York 12301
OSTI ID:
6336882
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 65:12; ISSN JAPIA
Country of Publication:
United States
Language:
English