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Exploratory development of thin film polycrystallline silicon photovoltaic devices. Production of self-supporting microcrystalline silicon films. Topical report No. 1

Technical Report ·
OSTI ID:6317508

Deposition of thin film polycrystalline silicon films on molybdenum substrates, and their separation, intact, during cooldown following the deposition process, have been repeatedly demonstrated. Deposition parameters using a high pressure plasma source have been studied for inputs of SiCl/sub 4/, SiHCl/sub 3/ and SiH/sub 2/Cl/sub 2/. Conditions for obtaining the best combination of deposition efficiency, throughput rate, and surface morphology are specified. These data were used to design a continuous system in which the Si films are deposited on all four walls of square boxes that are moved continuously down the high temperature chamber, thus permitting uniform film thickness and optimum throughput. The continuous apparatus incorporates series of sensors to permit safe and reproducible operation, and can be controlled entirely by a microprocessor system.

Research Organization:
Motorola, Inc., Phoenix, AZ (USA)
DOE Contract Number:
AC02-77CH00178
OSTI ID:
6317508
Report Number(s):
SERI/PR-9100-1-T1; ON: DE81026224
Country of Publication:
United States
Language:
English