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A method for characterizing a microprocessor's vulnerability to SEU

Conference · · IEEE Trans. Nucl. Sci.; (United States)
OSTI ID:6268166
; ; ;

The authors have developed a system that tests microprocessors for single event upset (SEU) at the specified clock speed and without adding wait or hold states. This system compiles a detailed record of SEU induced errors and has been used to test the Sandia SA3000 microprocessor and prototypes of its commercial equivalent, the Harris H80C85 at the Lawrence Berkeley Laboratory 88-inch cyclotron facility. Using appropriate test programs and analyzing the resulting upset data, the authors have established the SEU cross-section of the major functional elements of the hardened processors. With these cross-sections and the estimated duty factors of a typical program, the authors computed the expected upset rate in a parallel, normally incident beam as a function of linear energy transfer (LET), and measured the rate in several cyclotron beams. Good agreement between the measured and calculated rates was obtained.

Research Organization:
Space Sciences Lab., The Aerospace Corp., Los Angeles, CA (US)
OSTI ID:
6268166
Report Number(s):
CONF-880730-
Journal Information:
IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. 35:6; ISSN IETNA
Country of Publication:
United States
Language:
English

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Related Subjects

43 PARTICLE ACCELERATORS
430100 -- Particle Accelerators-- Design
Development
& Operation
440200 -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
654001* -- Radiation & Shielding Physics-- Radiation Physics
Shielding Calculations & Experiments
73 NUCLEAR PHYSICS AND RADIATION PHYSICS
99 GENERAL AND MISCELLANEOUS
990220 -- Computers
Computerized Models
& Computer Programs-- (1987-1989)
ACCELERATORS
COMPUTER CODES
COMPUTERS
CROSS SECTIONS
CYCLIC ACCELERATORS
CYCLOTRONS
ELECTRONIC CIRCUITS
ENERGY TRANSFER
HARDENING
LAWRENCE BERKELEY LABORATORY
LET
MICROELECTRONIC CIRCUITS
MICROPROCESSORS
NATIONAL ORGANIZATIONS
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATION HARDENING
SANDIA LABORATORIES
US AEC
US DOE
US ERDA
US ORGANIZATIONS