A radiation-hardened 16/32-bit microprocessor
Conference
·
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA)
- Sandia National Labs., Albuquerque, NM (US)
This paper reports on the development of single chip radiation-hardened 16/32-bit microprocessor. This device, the SA3300, is an emulation of National Semiconductor's NS32C016. The SA3300 is designed to withstand high levels of ionizing radiation and is resistant to single event upset (SEU) caused by heavy ions. New techniques were used to improve immunity to SEU effects in combinational logic. The authors' testing has demonstrated that the SA3300 is functional after a total gamma dose of 5 Mrad(Si). The device does not latch up from SEU, and parts without SEU resistors have an SEU linear energy transfer (LET) upset threshold greater than 28 MeV/mg/cm{sup 2}.
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 6907756
- Report Number(s):
- CONF-890723--
- Journal Information:
- IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) Vol. 36:6; ISSN 0018-9499; ISSN IETNA
- Country of Publication:
- United States
- Language:
- English
Similar Records
A radiation-hardened 16/32-bit microprocessor
SEU simulation and testing of resistor-hardened D-latches in the SA3300 microprocessor
SEU characterization and design dependence of the SA3300 microprocessor
Conference
·
Sat Dec 31 23:00:00 EST 1988
·
OSTI ID:6081851
SEU simulation and testing of resistor-hardened D-latches in the SA3300 microprocessor
Conference
·
Sat Nov 30 23:00:00 EST 1991
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
·
OSTI ID:5613797
SEU characterization and design dependence of the SA3300 microprocessor
Conference
·
Sun Dec 31 23:00:00 EST 1989
·
OSTI ID:6937613
Related Subjects
36 MATERIALS SCIENCE
360605 -- Materials-- Radiation Effects
42 ENGINEERING
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
99 GENERAL AND MISCELLANEOUS
990200 -- Mathematics & Computers
CHARGED PARTICLES
COMPUTERS
DESIGN
ELECTRICAL EQUIPMENT
ELECTROMAGNETIC RADIATION
ELECTRONIC CIRCUITS
ENERGY RANGE
ENERGY TRANSFER
EQUIPMENT
FABRICATION
GAMMA RADIATION
HARDENING
HEAVY IONS
IONIZING RADIATIONS
IONS
LET
MEMORY DEVICES
MEV RANGE
MEV RANGE 10-100
MICROELECTRONIC CIRCUITS
MICROPROCESSORS
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATION HARDENING
RADIATIONS
RESISTORS
SEMICONDUCTOR DEVICES
360605 -- Materials-- Radiation Effects
42 ENGINEERING
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
99 GENERAL AND MISCELLANEOUS
990200 -- Mathematics & Computers
CHARGED PARTICLES
COMPUTERS
DESIGN
ELECTRICAL EQUIPMENT
ELECTROMAGNETIC RADIATION
ELECTRONIC CIRCUITS
ENERGY RANGE
ENERGY TRANSFER
EQUIPMENT
FABRICATION
GAMMA RADIATION
HARDENING
HEAVY IONS
IONIZING RADIATIONS
IONS
LET
MEMORY DEVICES
MEV RANGE
MEV RANGE 10-100
MICROELECTRONIC CIRCUITS
MICROPROCESSORS
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATION HARDENING
RADIATIONS
RESISTORS
SEMICONDUCTOR DEVICES