Skip to main content
OSTI.GOVU.S. Department of Energy Office of Scientific and Technical Information
U.S. Department of Energy
Office of Scientific and Technical Information
 

SEU characterization and design dependence of the SA3300 microprocessor

Conference · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA)
DOI:https://doi.org/10.1109/23.101202· OSTI ID:5767746
; ; ; ;  [1];  [2]; ;  [3]
  1. Sandia National Labs., Albuquerque, NM (USA)
  2. L and M Associates, Albuquerque, NM (US)
  3. Martin Marietta Labs., Baltimore, MD (USA)
+ Show Author Affiliations

The SEU vulnerability of the SA3300 16-bit microprocessor has been characterized, and the effects of two different design revisions on error rate have been explored. The authors have found that the threshold for upset depends on the data pattern written into the general purpose registers. With all bits in the general purpose registers set to logic one, a design with 2-{mu}m n- and p-channel transistor lengths had a threshold LET of 35 MeV-cm{sup 2}/mg at 25{degrees} C and 4.5 volt operation. With all zero's stored in the registers the upset threshold increased by more than a factor of two to 83 MeV- cm{sup 2}/mg. A second design revision, with 1.25-{mu}m and 1.75-{mu}m n- and p-channel transistor lengths, respectively, was more vulnerable to upset, but exhibited a smaller dependence on logic state.

DOE Contract Number:
AC04-76DP00789
OSTI ID:
5767746
Report Number(s):
CONF-900723--
Journal Information:
IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) Vol. 37:6; ISSN 0018-9499; ISSN IETNA
Country of Publication:
United States
Language:
English

Similar Records

A radiation-hardened 16/32-bit microprocessor
Conference · Thu Nov 30 23:00:00 EST 1989 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) · OSTI ID:6907756
SEU simulation and testing of resistor-hardened D-latches in the SA3300 microprocessor
Conference · Sat Nov 30 23:00:00 EST 1991 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) · OSTI ID:5613797
Intrinsic SEU reduction from use of heterojunctions in gallium arsenide bipolar circuits
Conference · Mon Nov 30 23:00:00 EST 1987 · IEEE Trans. Nucl. Sci.; (United States) · OSTI ID:7202045

Related Subjects

42 ENGINEERING
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COMPUTERS
DATA
DESIGN
ELECTRIC CONDUCTIVITY
ELECTRICAL EQUIPMENT
ELECTRICAL PROPERTIES
ELECTRONIC CIRCUITS
ENERGY
EQUIPMENT
ERRORS
FEEDBACK
INFORMATION
LASERS
LOGIC CIRCUITS
MICROELECTRONIC CIRCUITS
MICROPROCESSORS
PHOTOCONDUCTIVITY
PHYSICAL PROPERTIES
PHYSICAL RADIATION EFFECTS
PULSES
RADIATION EFFECTS
RESISTORS
SEMICONDUCTOR DEVICES
SOLID STATE LASERS
TEMPERATURE DEPENDENCE
THRESHOLD ENERGY
TRANSISTORS