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Solid-phase epitaxy of Ti-implanted LiNbO/sub 3/

Journal Article · · J. Mat. Res.; (United States)
OSTI ID:6266247
The solid-phase epitaxy of LiNbO/sub 3/ following ion implantation of Ti dopant for the purpose of producing optical waveguides has been studied. Implanting 360-keV Ti at liquid nitrogen temperature produces a highly damaged region extending to a depth of about 400 nm. This essentially amorphous region can be recrystallized epitaxially by annealing in a water-saturated oxygen atmosphere at temperatures near 400 /sup 0/C, though complete removal of all irradiation-induced damage requires temperatures in excess of 600 /sup 0/C. The activation energy of the regrowth is 2.0 eV for implanted fluences below 3 x 10/sup 16/ Ti/cm/sup 2/. At higher fluences of the regrowth proceeds more slowly, and Ti dopant segregates at the regrowth interface. Complete recrystallization following high-dose implantation requires annealing temperatures in excess of 800 /sup 0/C.
Research Organization:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
OSTI ID:
6266247
Journal Information:
J. Mat. Res.; (United States), Journal Name: J. Mat. Res.; (United States) Vol. 4:2; ISSN JMREE
Country of Publication:
United States
Language:
English