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Title: Microstructural characterization of YBaCuO thin films deposited by rf magnetron sputtering as a function of annealing conditions

Journal Article · · Journal of Materials Research; (USA)
;  [1];  [2]
  1. Physics Department, Syracuse University, 201 Physics Building, Syracuse, New York (US)
  2. CVC Products Inc., Rochester, New York (US)

Thin films of Y{sub 1}Ba{sub 2}Cu{sub 3}O{sub 7{minus}{ital x}} have been prepared on MgO, SrTiO{sub 3}/Al{sub 2}O{sub 3}, and Al{sub 2}O{sub 3} substrates by rf magnetron sputtering. A buffer layer of SrTiO{sub 3} was deposited on Al{sub 2}O{sub 3} by flash evaporation. The as-deposited films on MgO and SrTiO{sub 3}/Al{sub 2}O{sub 3} had an (00{ital l}) orientation whereas the films on Al{sub 2}O{sub 3} were randomly oriented. The lattice parameters along the c-axis for the as-deposited films on MgO and SrTiO{sub 3}/Al{sub 2}O{sub 3} were longer than the value for bulk crystals and decreased by annealing in oxygen. The critical temperatures ({ital T}{sub {ital c}}) of the superconducting transitions increased with gradual shortening of the {ital c} lattice parameter. These changes in {ital T}{sub {ital c}}'s and {ital c}'s were attributed to the reduction in the concentration of crystal defects formed during sputter deposition. A detailed x-ray diffraction study of YBaCuO on MgO and SrTiO{sub 3}/Al{sub 2}O{sub 3} was carried out and values for the particle sizes and nonuniform strain were obtained by using an integral breadth method. It was observed that changes in {ital T}{sub {ital c}} were related to the reduction in nonuniform strain. The presence of preferred orientation and grain growth after annealing was also studied. The highest {ital T}{sub {ital c}}'s tended to occur when the (00{ital l}) texture was strongest.

OSTI ID:
6259243
Journal Information:
Journal of Materials Research; (USA), Vol. 6:2; ISSN 0884-2914
Country of Publication:
United States
Language:
English