Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Photoemission studies of the systematics of metal/HgCdTe interface formation

Journal Article · · Appl. Phys. Commun.; (United States)
OSTI ID:6250313
Ag, Ge, Cr, and Sm - materials of widely ranging chemical reactivity were deposited in situ onto cleaved HgCdTe substrates. Synchrotron-radiation photoemission studies of these interfaces show differences in surface chemistry and morphology which they relate to the chemical reactivity of the deposited metal.
Research Organization:
McDonnell Douglas Research Labs., St. Louis, MO
OSTI ID:
6250313
Journal Information:
Appl. Phys. Commun.; (United States), Journal Name: Appl. Phys. Commun.; (United States) Vol. 7:1-2; ISSN APCOD
Country of Publication:
United States
Language:
English