Local stoichiometry and atomic interdiffusion during reactive metal/mercury-cadmium-telluride junction formation. Interim report

Technical Report · Fri Oct 23 00:00:00 EDT 1987

OSTI ID:5475055

Wall, A; Raisanen, A; Chang, S; Philip, P; Troullier, N

Synchrotron-radiation photoemission studies of Ag, Ge, and Sm overlayers on Hg1-xCdxTe (110) surfaces are summarized. These metals exhibit widely different interface reactivity with Hg/sub 1-x/Cd/sub x/Te and yield a range of different interface morphologies. To assess the relative importance of the microscopic driving forces that determine the local composition at the interface and in the semiconductor near-surface region, the authors present a systematic comparison the data with calculated thermodynamic parameters such as the cation-metal heat of solution, the heat of alloying from Miedema's semi-empirical model, and the metal/telluride formation enthalpy.

• Research Organization: Minnesota Univ., Minneapolis (USA). Dept. of Chemical Engineering and Materials Science
• OSTI ID: 5475055
• Report Number(s): AD-A-187554/1/XAB; TR-12
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
36 MATERIALS SCIENCE
CADMIUM TELLURIDES
SEMICONDUCTOR JUNCTIONS
MERCURY TELLURIDES
INTERFACES
ENTHALPY
METALS
MORPHOLOGY
PHOTOELECTRIC EMISSION
STOICHIOMETRY
SURFACES
THERMODYNAMICS
CADMIUM COMPOUNDS
CHALCOGENIDES
ELECTRON EMISSION
ELEMENTS
EMISSION
JUNCTIONS
MERCURY COMPOUNDS
PHYSICAL PROPERTIES
TELLURIDES
TELLURIUM COMPOUNDS
THERMODYNAMIC PROPERTIES
420800* - Engineering- Electronic Circuits & Devices- (-1989)
360603 - Materials- Properties