Determination of the optical functions of transparent glasses by using spectroscopic ellipsometry
- Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee (USA)
Two-channel spectroscopic polarization-modulation ellipsometry measurements have been made on four different glasses (fused SiO{sub 2}, fine-annealed BK-7, a lead-indium-phosphate glass, and a germanium-arsenic-selenium glass). We show that this technique is sensitive to thin surface layers and that these surface layers can be modeled by using the Bruggeman effective-medium theory with 50% glass and 50% voids. By correcting the experimental spectra for these surface layers, we determined the refractive index of the sample within an error of {plus minus}0.002 in the transparent region. For wavelength regions where the material is normally opaque, the ellipsometric data can be corrected for this overlayer, thereby increasing the accuracy of the determination of both the refractive index and the extinction coefficient.
- DOE Contract Number:
- AC05-84OR21400
- OSTI ID:
- 6244984
- Journal Information:
- Applied Optics; (United States), Vol. 30:30; ISSN 0003-6935
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
GLASS
ELLIPSOMETRY
OPTICAL PROPERTIES
MEASURING METHODS
EXPERIMENTAL DATA
POLARIMETRY
REFRACTIVE INDEX
SILICA
SPECTROSCOPY
CHALCOGENIDES
DATA
INFORMATION
MINERALS
NUMERICAL DATA
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
SILICON COMPOUNDS
SILICON OXIDES
440600* - Optical Instrumentation- (1990-)