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Micro-inhomogeneity effects and radiation damage in semi-insulating GaAs radiation detectors

Journal Article · · IEEE Transactions on Nuclear Science
DOI:https://doi.org/10.1109/23.682454· OSTI ID:624189
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  1. Univ. of Glasgow (United Kingdom). Dept. of Physics and Astronomy
  2. Vilnius Univ. (Lithuania)
Thermally-stimulated current (TSC) measurements and a detailed analysis of current-voltage (I-V) characteristics have been made on semi-insulating GaAs (SI-GaAs) Schottky diode particle detectors, fabricated on substrates from several supplies, before and after irradiation with 24 GeV protons and 300 MeV pions. The analysis of I-V characteristics allows the determination of the barrier height and bulk resistance in detectors. Changes observed in I-V characteristics and TSC spectra after irradiation are described and a dislocation-net model of radiation-damaged devices is proposed.
OSTI ID:
624189
Report Number(s):
CONF-971147--
Journal Information:
IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 3Pt1 Vol. 45; ISSN 0018-9499; ISSN IETNAE
Country of Publication:
United States
Language:
English