Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Sub-200 picosecond GaAs sample-and-hold circuit for a multi-gigasample/second integrated circuit

Conference ·
OSTI ID:6210854

We report initial results on a digital/analog, 1-micron gate GaAs MESFET IC whose purpose is to record with bandwidths exceeding 1 GHz nonrepetitive analog transient waveforms of a few nanoseconds duration. Specialized buffered-fet logic digital circuits with T/sub pd/ as low as 70 psec generate a pulse burst that strobe a series of 20 linear gate sample-and-hold circuits. These 3-gate MESFET sampling circuits have demonstrated sampling apertures of less than 200 psec, without pretriggering required. Backgating effects on the circuit design and performance and high speed techniques are reviewed. Earlier work (1) on this scheme has been extended from 1nsec step inputs to 100 psec and variable biasing in the linear gate circuit has been added.

Research Organization:
Lawrence Livermore National Lab., CA (USA)
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
6210854
Report Number(s):
UCRL-92947; CONF-851237-2; ON: DE86002598
Country of Publication:
United States
Language:
English

Similar Records

Ionizing radiation hardness of GaAs technologies
Conference · Mon Nov 30 23:00:00 EST 1987 · IEEE Trans. Nucl. Sci.; (United States) · OSTI ID:7031567

GaAs analog to digital converter and memory IC's for ultra high speed transient recording
Journal Article · Mon Jan 31 23:00:00 EST 1983 · IEEE Trans. Nucl. Sci.; (United States) · OSTI ID:5941947

The need for a wholistic design approach
Journal Article · Wed Oct 01 00:00:00 EDT 1986 · Computer; (United States) · OSTI ID:5128017