Synthesis and physical properties of bismuth orthotantalate (BiTaO/sub 4/)

Journal Article · Wed Jul 20 04:00:00 EDT 1988 · J. Appl. Chem. USSR (Engl. Transl.); (United States)

OSTI ID:6183297

Popolitov, V I; Aliev, R M

The conditions of synthesis of bismuth orthotantalate were studied by the standard hydrothermal technique, using batch-type autoclaves. The chemical media used for synthesis of bismuth orthotantalate were water, aqueous potassium hydrogen fluoride solution, and a mixed aqueous solution of the latter with hydrogen peroxide. X-ray structure analysis of BiTaO/sub 4/ single crystals confirmed the rhombic system of the crystals. The dielectric properties of BiTaO/sub 4/ single crystals were studied on plates in the (001) direction. The BiTaO/sub 4/ single crystals were tested for generation of the second optical harmonic.

• OSTI ID: 6183297
• Journal Information: J. Appl. Chem. USSR (Engl. Transl.); (United States), Journal Name: J. Appl. Chem. USSR (Engl. Transl.); (United States) Vol. 61:2; ISSN JAPUA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360201* -- Ceramics
Cermets
& Refractories-- Preparation & Fabrication
360202 -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
360204 -- Ceramics
Cermets
& Refractories-- Physical Properties
ANTIFERROELECTRIC MATERIALS
BIREFRINGENCE
BISMUTH COMPOUNDS
BISMUTH OXIDES
CHALCOGENIDES
CHEMICAL ANALYSIS
COHERENT SCATTERING
CRYSTAL LATTICES
CRYSTAL STRUCTURE
CRYSTALS
DIELECTRIC MATERIALS
DIELECTRIC PROPERTIES
DIFFRACTION
ELECTRICAL PROPERTIES
ELECTRICITY
ELECTROMAGNETIC RADIATION
ELECTRON MICROPROBE ANALYSIS
HARMONICS
HYSTERESIS
LASER RADIATION
LATTICE PARAMETERS
MATERIALS
MICROANALYSIS
MONOCRYSTALS
OPTICAL PROPERTIES
ORTHORHOMBIC LATTICES
OSCILLATIONS
OXIDES
OXYGEN COMPOUNDS
PERMITTIVITY
PHASE TRANSFORMATIONS
PHYSICAL PROPERTIES
PIEZOELECTRICITY
PYROELECTRIC EFFECT
RADIATIONS
REFRACTION
REFRACTIVITY
REFRACTORY METAL COMPOUNDS
SCATTERING
SYNTHESIS
TANTALATES
TANTALUM COMPOUNDS
TANTALUM OXIDES
TRANSITION ELEMENT COMPOUNDS
X-RAY DIFFRACTION