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EXAFS studies of multilayer interfaces

Conference ·
DOI:https://doi.org/10.1557/PROC-143-133· OSTI ID:6180600
;
Important for the understanding of multilayer materials is a determination of their interface structure. The extended x-ray absorption fine structure (EXAFS) technique can be useful, particularly for interfaces with a high degree of structural disorder. This paper reviews the application of EXAFS to multilayers, and describes the standing wave enhancement of the EXAFS from multilayer interfaces. Examples are given for W-C and Ni-Ti multilayers. 6 refs., 6 figs.
Research Organization:
Brookhaven National Lab., Upton, NY (USA). Medical Dept.
DOE Contract Number:
AC02-76CH00016
OSTI ID:
6180600
Report Number(s):
BNL-41404; CONF-881155-55; ON: DE89009527
Country of Publication:
United States
Language:
English

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Related Subjects

36 MATERIALS SCIENCE
360102 -- Metals & Alloys-- Structure & Phase Studies
656003* -- Condensed Matter Physics-- Interactions between Beams & Condensed Matter-- (1987-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BRAGG REFLECTION
CARBON
ELEMENTS
EQUATIONS
FINE STRUCTURE
FOURIER TRANSFORMATION
INTEGRAL TRANSFORMATIONS
INTERFACES
LAYERS
METALS
NICKEL
NONMETALS
REFLECTION
TITANIUM
TRANSFORMATIONS
TRANSITION ELEMENTS
TUNGSTEN