EXAFS at grazing incidence: Data collection and analysis

Journal Article · Wed Jan 01 04:00:00 EST 1992 · Review of Scientific Instruments; (United States)

DOI:https://doi.org/10.1063/1.1142632· OSTI ID:5645496

Heald, S M ^[1]

---

1. Brookhaven National Laboratory, Upton, New York 11973 (United States)

Extended x-ray absorption fine structure (EXAFS) at grazing incidence can be applied to a large variety of surface and interface problems. This paper discusses in detail the collection and analysis of such data using interface EXAFS from metal/Al bilayers as an example. A comparison of the fluorescence and reflectivity detection channels is given, along with a discussion of the methods for correction of anomalous dispersion distortions. In addition, data from a Ni-Ti multilayer is used to demonstrate the potential of enhancing the sensitivity of the EXAFS signal to selected regions using standing wave effects.

• DOE Contract Number: AC02-76CH00016; AS05-80ER10742
• OSTI ID: 5645496
• Journal Information: Review of Scientific Instruments; (United States), Journal Name: Review of Scientific Instruments; (United States) Vol. 63:1; ISSN RSINA; ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

440101* -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ALUMINIUM
DATA
DATA ACQUISITION
DATA ANALYSIS
ELEMENTS
EQUIPMENT
EXPERIMENTAL DATA
INFORMATION
METALS
NICKEL
NUMERICAL DATA
RADIATION SOURCES
SYNCHROTRON RADIATION SOURCES
TITANIUM
TRANSITION ELEMENTS
X-RAY EQUIPMENT